Abstract
Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological properties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the material with this operation mode and to create micro-controlled defects, in diameter and depth, to growing of quantum dots in semiconductor materials. In this paper, we discuss the fundamentals of this technique.
Highlights
Atomic Force Microscope (AFM) has been used as a powerful tool for the study of surface properties at the nanoscale (HYON et al, 2000; DU et al, 2001)
As medições da energia dissipada entre a ponta de um AFM e a superfície de uma amostra foram usadas para analisar as variações nas propriedades mecânicas e tribológicas dos materiais, utilizando o modo de tapping do AFM para obter imagens de topografia e de contraste de fase
AFM nanolithography has proven to be a unique tool for material structuring and patterning with nanometer precision
Summary
As medições da energia dissipada entre a ponta de um AFM e a superfície de uma amostra foram usadas para analisar as variações nas propriedades mecânicas e tribológicas dos materiais, utilizando o modo de tapping do AFM para obter imagens de topografia e de contraste de fase. Foi possível realizar indentações no material através desse modo de operação e criar defeitos micro controlados, em diâmetro e profundidade, para o crescimento de pontos quânticos em materiais semicondutores. Palavras-chave: contraste de fase, deformações plásticas, ponta, nanoescala
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