LP-HS Logic Evaluation on TSMC 0.18μm CMOS Technology

Abstract

Present paper analyses different aspects of “Low Power-High Speed” (LP-HS) logic in favour of present day ULSI system focus. At first, the speed-power efficiency of LP-HS logic is investigated by designing some basic digital building blocks like Buffer, OR, AND, XOR etc. Next, the Voltage Transfer Characteristics (VTC), Noise Margin (NM) and the temperature effect on logic threshold with respect to LP-HS Buffer circuit are examined. The robustness and reliability of LP-HS Logic has been measured in terms of corner analysis with TT (Typical), FF (Fastest) and SS (Slowest) PVT (Process Voltage Temperature) variations on LP-HS XOR circuit. The worst case delay and PDP variation is recorded. Finally the 8:1 Multiplexer is designed, optimized and evaluated based on LP-HS Logic. The evaluated results are compared with some recent competitive designs to benchmark. To resolve reliability issue the corner analysis with PVT variation has been performed on designed 8:1 Multiplexor circuit. All the simulations are done on TSMC 0.18μm CMOS technology using Tanner EDA V.13 at 25°C temperature with 1.8V supply rail.