Low‐frequency electric fields induced in spherical cells with gap junctions

Abstract

The electric field induced in the interior of a chain of spherical cells joined by gap junctions is determined when the chain is exposed to low‐frequency incident axial or transverse electric fields. When the incident field is axial, the induced electric field increases stepwise as the number of cells in the chain is increased. For cells with the assumed properties the axial field in the interior equals the incident field outside the chain when the number of cells equals or exceeds 200. For cells with different properties this number will change. When the incident field is transverse to the axis of the chain, the electric field induced in each of the spherical cells in the chain is the same as that in a single isolated spherical cell.