Abstract
We have performed X-ray diffraction (XRD) and AC magnetic susceptibility measurements on polycrystalline LaMn2–xNixSi2 (0.0 ≤ x ≤ 2.0) silicides for magnetic characterization in fields of about a few Oe at a temperature range 15–325 K. All compounds crystallize in the naturally layered ThCr2Si2-type structure with the space group I4/mmm. Substitution of Ni for Mn leads to a linear decrease in the lattice constant c and the unit cell volume, while it gives rise to a change of magnetic properties from ferromagnetic to anti-ferromagnetic behavior for small values of x < 1. The sample with x = 0.8 has a Neel temperature of about 35 K, associated with anti-ferromagnetic behavior. However, for x = 1, anti-ferromagnetic behavior is diminished and paramagnetic behavior becomes dominant. For x = 2, the sample becomes virtually non-magnetic. The samples with x ≤ 0.5 exhibit mixed magnetic properties composed of ferromagnetic and anti-ferromagnetic interactions, below the Curie temperature TC(Mn). The results are collected in the magnetic phase diagram. (© 2004 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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