Abstract
A high efficiency γ-ray detection system based on a 12′′×12′′ NaI(Tl) bore hole detector has been used to measure the strength of low-energy narrow resonances in proton-induced capture reactions. The strengths of the Ep=324 keV and the Ep=416 keV resonances in 29Si(p,γ)30P and of the Ep=620 keV resonance in 30Si(p,γ)31P have been measured. The applicability of these resonances for high resolution depth profiling in materials analysis is discussed.
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