Abstract

Abstract Nitrogen (N) ions were impinged during the epitaxial growth of GaAs using combined ion beam and molecular beam epitaxy (CIBMBE) method. Low-temperature photoluminescence measurements showed that incorporated nitrogen ([N] 18 cm −3 ) is optically active with a substrate temperature of 550°C and a N + ion acceleration energy of 100 eV. For higher [N] of ∼2×10 18 cm −3 , N-related emissions can be found after high temperature (650–850°C) annealing. We discuss the annealing effects and also the novel emissions found after annealing at high temperature (750°C) with a [N] of ∼1×10 19 cm −3 .

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call