Abstract
This paper describes a method of generating low-distortion sinusoidal waves using an arbitrary waveform generator (AWG), and experimental results of using such a generator for ADC dynamic performance testing. With this proposed method, 3rd order harmonics of the generated signal are suppressed simply by changing the AWG program (or waveform memory contents)—AWG nonlinearity identification is not required—and spurious components, generated far from the signal band, are relatively easy to remove using an analog filter; our theoretical analyses, simulations, and experiments showed that a simple passive LC analog filter (with relaxed requirements compared to the one for direct HD3 removal) is sufficient. Our ADC testing results—using signals generated by an AWG with the proposed algorithm, and a simple passive LC LPF—show measurement errors (caused by 3rd order harmonics generated by AWG DAC nonlinearity) half that of previous algorithms.
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