Abstract

The ability to visualize detailed 3-dimensional surface topology with SEM at low voltage and high resolution holds profound promise for analyzing liquid crystal textures, both in polymers and other macromolecular forms. Director textures, domain boundaries, and defects such as inversion walls, disclinations and dislocations can now be easily visualized with this technique. Studies concerning the effects of shear flow and magnetic fields on these defects are currently under way.Resolution of 4.0 nm at 1.0 keV is now possible with commercial SEM's, which incorporate the latest advances in lens design optimized for low voltage operation, and use high brightness, low energy spread field emission electron guns. The low energy spread of the field emission gun reduces chromatic aberration effects and facilitates successful operation at low keV. Low voltage operation provides dramatically improved image contrast due to the smaller beam/sample interaction volume and also greatly reduces sample charging artifacts. By operating at near crossover conditions, the need for coating nonconducting specimens with a conducting layer of metal or carbon is greatly reduced or eliminated.

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