Low-temperature preparation of self-polarized Pb(Mg1/3Nb2/3)O3–PbTiO3 films on well crystallized LaNiO3 electrodes

Abstract

0.68Pb(Mg1/3Nb2/3)O-3-0.32PbTiO(3) (PMN-PT) films were deposited on [100]-oriented LaNiO3 (LNO) electrodes with two different crystallinities by a sal-gel method. A phase-pure PMN-PT film can be formed on the well crystallized LNO electrode at 500 degrees C, 100 degrees C lower than the film deposited on the LNO electrode with lower crystallinity. All the phase-pure PMN-PT films are self-polarized. With the increase of the annealing temperature from 500 to 650 degrees C, the mean piezoelectric coefficient (d(33)) of the films deposited on the well crystallized LNO electrodes increases from 11 to 257 pm/V. This phenomenon is assigned to the defect dipoles and residual stress. (C) 2013 Elsevier B.V. All rights reserved.