Abstract
Nanoindentation technique at low temperatures have developed from initial micro-hardness driving method at a single temperature to modern depth-sensing indentation (DSI) method with variable temperatures over the last three decades. The technique and implementation of representative cooling systems adopted on the indentation apparatuses are discussed in detail here, with particular emphasis on pros and cons of combination with indentation technique. To obtain accurate nanoindentation curves and calculated results of material properties, several influence factors have been carefully considered and eliminated, including thermal drift and temperature induced influence on indenter and specimen. Finally, we further show some applications on typical materials and discuss the perspectives related to low temperature nanoindentation technique.
Highlights
Nanoindentation technique has become one of the most popular mechanical property testing methods in recent years [1,2,3,4,5]
Combining with subsequent testing analysis procedures on residual impressions, such as focused ion beam (FIB), scanning electron microscope (SEM), and transmission electron microscope (TEM) methods, the complex evolvement caused by nanoindentation at low temperatures can be observed intuitively [15,16,17,18]
Different from the dimension measurement of residual impression in micro-hardness testing, the microscope in nanoindentation technique is mainly used for determine indentation region of the specimen, as the size of the residual impression conducted by nanoindentation is so tiny
Summary
Nanoindentation technique has become one of the most popular mechanical property testing methods in recent years [1,2,3,4,5]. The researchable aspects are limited to variation of specific mechanical parameters with temperature decreasing, while high hydrostatic pressure, shear stress, and local strain can be realized via nanoindentation method [12,13,14]. Combining with subsequent testing analysis procedures on residual impressions, such as focused ion beam (FIB), scanning electron microscope (SEM), and transmission electron microscope (TEM) methods, the complex evolvement caused by nanoindentation at low temperatures can be observed intuitively [15,16,17,18]. Hroouwghevmeri,ctrhoe-hgarredantesst.stTrhenugs,threosfeamrcichreor-shadredvnoetessdtetochfniniqduae ims othre ecoffnicvienitenmt aenthdoidntutiotivoebtteasitningthperocheadrudrnee,sws hoilfe tmheaotebrsiearlvautniodneur ntdinerySEinMdeconmtaptiloicnatelodatdh,e haanrddntehses nacaqnuoiisnitdioentpatrioocnesws athsrdoeuvgehlompiecdroi-nhasrudcncessi.oTnh.us, researchers devoted to find a more efficient method
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