Abstract
Here, we present the design and test-operation performance of a low-temperature field emission (FE) system which can be employed to image and characterize the FE beam from low-temperature tips. Three radiation shields cooled by liquid helium and liquid nitrogen cryostats surround the FE tips and anodes completely. Once the FE system is cooled down to 5 K, experiments can run for more than 15 h without interruption. The design allows not only for the exchange of tips and anodes by load-lock equipment but also for the adjustment of tip–anode distance using a piezo-tube. Test runs in projection microscopy mode have presented clear diffraction-fringe patterns near the shadows of nano objects at temperatures from room temperature to 5.5 K, indicating that the system is well suited for the investigation of the coherence of electron beam from FE tip.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
