Abstract
Dielectric properties of Nb2O5(0.92):SiO2(0.08) ceramic were measured in the temperature range of 10–300 K by the cryostat system. Frequency-dependent dielectric loss suggests the relaxation behavior of this material. The relaxation mechanism was analyzed by the Arrhenius relationship and the Cole–Cole plot. Calculated distribution of relaxation time reveals deviation from the pure Debye relaxation.
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