Abstract
We report on the fabrication and characterization of a porous silicon omnidirectional reflector formed by periodic substructures stacked together. For these substructures, a low refractive index contrast has been used, resulting in substructures without omnidirectional reflectivity band. The use of a low refractive index contrast involves the reduction of the requirements to obtain omnidirectional reflectors. We demonstrate the existence of an omnidirectional reflectivity range with a high gap-to-midgap ratio by means of reflectivity spectra measurements for a range of incidence angles. The results are in good agreement with a theoretical model of the reflector. The fabricated structure is the first reported porous silicon reflector suitable for 1.55 μm applications.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
