Low-Ohmic Nickel Contacts on N-Type 4H-SiC by Surface Roughness Dependent Laser Annealing Energy Density Optimization

Abstract

In this work, the influence of different surface roughness and surface treatments on the minimum energy density required to form low-ohmic nickel contacts on n-type 4H-SiC by laser annealing was investigated. The annealing was performed by a frequency-tripled Nd:YVO4 laser with a pulse duration of 50 ns. To evaluate the effects, the grinded or polished C-side of 4H-SiC wafers with surface roughness between 0.3 and 70 nm was sputter-deposited with nickel and subsequent laser annealed. Sheet resistance measurements showed that the minimum energy density required to achieve a low-resistance contact depends significantly on the surface roughness. The rougher the surface, the lower the minimum energy density to form a low-ohmic contact.