Abstract
We report on the fabrication and characterization of low-loss planar and stripe waveguides in a Nd3+-doped glass by 6MeV oxygen-ion implantation at a dose of 1×1015ions∕cm2. The dark mode spectroscopy of the planar waveguide was measured using a prism coupling arrangement. The refractive index profile of the planar waveguide was reconstructed from a code based on the reflectivity calculation method. The results indicate that a refractive index enhanced region as well as an optical barrier have been created after the ion beam processing. The near-field mode profiles of the stripe waveguide were obtained by an end-fire coupling arrangement, by which three quasitransverse electric modes were observed. After annealing, the propagation losses of the planar and stripe waveguides were reduced to be ∼0.5 and ∼1.8dB∕cm, respectively.
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