Abstract
AbstractLow dielectric-constant mesoporous silica films were prepared by condensation of a silicate network around surfactant micellar structures. Adherent, porous films 0.5–1.0 μm in thickness, and containing an ordered assemblage of ≈2 nm diameter pores were synthesized by spin-coating water/ethanol-based solutions containing a silica precursor and surfactant template. In this paper, film deposition conditions are described, and film thickness, porosity, refractive index and dielectric constant measured by ellipsometry are presented. Using a coating solution containing tetraethyl orthosilicate (TEOS) and a cationic cetyltrimethylammonium chloride (CTAC) surfactant template, the film porosity and dielectric properties were controlled over a wide range by adjusting the CTAC/TEOS molar ratio. With the CTAC/TEOS ratio between 0.1 and 0.15, the pores were highly ordered in hexagonal arrays after heat treatment at 550 °C. With a CTAC/TEOS ratio of 0.21, films with a pore volume of ≈64% (≈36 vol% silica) could be synthesized. The measured index of refraction for these highly porous films at 500 nm wavelength was 1.16, indicating that these films are potentially useful as low K interlayer dielectrics.
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