Abstract
In this paper a model of low-frequency noise in thick-film structures based on the close relationship of the noise and conduction mechanisms is presented. The emphasis is placed on the presence of traps in thin, glass barriers as the least studied source of low-frequency noise in thick-film structures under conditions of dominant tunneling current flow. The influence of contacts between some of the adjacent conducting particles on noise is discussed. From numerical simulation, fitting the experimental results and theoretical curve based on the proposed model, we found that the noise is sensitive to the thick-film structure.
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