Low-frequency noise in solid-state nanopores

Abstract

Low-frequency ionic current noise in solid-state nanopores imposes a limitationon the time resolution achieved in translocation experiments. Recently, this1/f noise was described as obeying Hooge’s phenomenological relation, where the noise scalesinversely with the number of charge carriers present. Here, we consider an alternativemodel in which the low-frequency noise originates from surface charge fluctuations. Wecompare the models and show that Hooge’s relation gives the best description forthe low-frequency noise in solid-state nanopores over the entire salt regime from10−3 to1.6 M KCl.