Abstract
The low-frequency flux noise of a narrow current-carrying superconducting film is measured in order to examine the flux noise induced by shielding current in directly coupled high critical temperature superconducting quantum interference devices. Reversible flux noise is found to appear during the application of current above a threshold level, but to disappear when the current is removed. However, as the current is increased beyond a second threshold, where the strip enters a flux creep∕flow state, a flux noise occurs that remains after the current is removed. The threshold current for the onset of the reversible flux noise strongly depends on the edge-shape processing applied to the strip. The sources of the reversible and remaining flux noises are discussed on the basis of existing models of vortex penetration and pinning in a superconducting thin film.
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