Low energy electron attachment to C60

Abstract

Low energy electron attachment to the fullerene molecule (C60) and its temperature dependence are studied in a crossed electron beam–molecular beam experiment. We observe the strongest relative signal of C60 anion near 0 eV electron energy with respect to higher energy resonant peaks confirming the contribution of s-wave capture to the electron attachment process and hence the absence of threshold behavior or activation barrier near zero electron energy. While we find no temperature dependence for the cross-section near zero energy, we observe a reduction in the cross-sections at higher electron energies as the temperature is increased, indicating a decrease in lifetime of the resonances at higher energies with increase in temperature.