Low-cost test technique using a new RF BIST circuit for 4.5–5.5 GHz low noise amplifiers

Abstract

This paper presents a low-cost test technique using a new RF Built-In Self-Test (BIST) circuit for 4.5–5.5GHz low noise amplifiers (LNAs). The test technique measures input impedance, voltage gain, noise figure, input return loss and output signal-to-noise ratio of the LNA. The BIST circuit is designed using 0.18μm SiGe technology. The BIST circuit contains test amplifier and RF peak detectors. The complete measurement set-up contains LNA with BIST circuit, external RF source, RF relays, 50Ω load impedance, and a DC voltmeter. The test technique utilizes output DC voltage measurements and these measured values are translated to the LNA specifications such as input impedance and gain through the developed equations. The technique is simple and inexpensive.