Abstract

The need for digital calibration due to large variations in fine-geometry processes as well as the need for performance locking mechanisms to prevent IC piracy have resulted in the prevalent use of digital assistance for analog circuits. In order to ensure the secure and reliable operation of the system, the performance of the analog circuits needs to be monitored in the field with robust, low-cost methods. In this paper, we propose a method reliant on monitoring simple invariants for detecting performance degradation of digitally-assisted analog circuits. We demonstrate the proposed method on two circuits: a low drop-out voltage regulator (LDO) and an active low-pass filter. Extensive Monte-Carlo simulations confirm that the proposed method detects deviations in performance due to tampering.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.