Abstract
There are a number of factors that limit transmission electron microscope (TEM) characterization. For example, when it is necessary to statistically assess large numbers of samples quickly, conventional time consuming film recording is not a plausible solution. In the case of many electron beam sensitive biological, polymeric, and fiber materials, great care must be taken to avoid both specimen damage or structure change by using minimum electron beam current densities. On the other hand, for mineral specimens, which are in general difficult to thin, maximum electron beam currents may not be high enough to produce anything but faint TEM images. As a result, a low cost portable TEM image (TEMI) intensifier was developed that allows both direct viewing of faint electron diffraction phenomenon as well as conventional TEM viewing. Figure 1 shows the portable high gain TEMI intensifier.
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