Abstract
Neutron diffraction measurements on weakly scattering or highly absorbing samples may demand custom mounting solutions. Two low-background sample holders based on inexpensive single-crystal silicon are described. One uses a conventional cylindrical geometry and is optimized for weakly scattering materials, while the other has a large-area flat-plate geometry and is designed for use with highly absorbing samples. Both holders yield much lower backgrounds than more conventional null-matrix or null-scattering materials and are essentially free from interfering Bragg peaks.
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