Abstract
By utilizing the spin-dependent mean free paths in Co, a polarizer-analyzer system for hot electrons has been established, enabling ballistic electron emission microscopy to measure the effects of scattering on the spin-dependent transport of hot electrons. Through the gradual oxidation of Al, it is possible to controllably increase the scattering effects of a Cu–Al–Cu spacer layer. As scattering increases, the measured polarization exiting the spacer decreases. The effect is explained by a straightforward Auger-like hot-electron scattering process which conserves spin flux but reduces the polarization of a hot-electron current through generation of energetic electron-hole pairs.
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