Abstract
The loss distributions in silica-based waveguides are successfully measured using a jaggedness-free optical low coherence reflectometer (OLCR). The OLCR reduces the unavoidable jagged fluctuations which appear in Rayleigh backscattering measurements undertaken with conventional OLCRs to within ± 1 dB by averaging the wavelength-dependent Rayleigh backscatter signals. Constant loss distributions and a step-like loss increase in the waveguides were clearly observed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
