Abstract
<div class="section abstract"><div class="htmlview paragraph">The purpose of the Los Alamos High-Energy Neutron Testing Handbook is to provide user information and guidelines for testing Integrated Circuits (IC) and electronic systems at the Irradiation of Chips and Electronics (ICE) Houses at the Los Alamos Neutron Science Center (LANSCE) at Los Alamos National Laboratory (LANL). Microelectronic technology is constantly advancing to higher density, faster devices and lower voltages. These factors may increase device susceptibility to radiation effects. The high-energy neutron source at LANSCE/LANL provides the capability for accelerated neutron testing of semiconductor devices and electronic systems and to simulate effects in various neutron environments.</div></div>
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: SAE International Journal of Advances and Current Practices in Mobility
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
