Abstract
We experimentally measure the scattered reflectance of particles deposited on smooth substrates with a mid-wave to long-wave supercontinuum source and a FTIR based sensor at 3.6 m. We measure the scattering return from sparse particles of 1,3,5-Trinitroperhydro-1,3,5-triazine, caffeine, and acetaminophen deposited on smooth aluminum, silicon, and glass substrates. We also measure mono-disperse 5.4, 10.8, and 19.4 μm diameter polystyrene spheres deposited on aluminum. We demonstrate that spectra obtained using our supercontinuum FTIR sensor can be accurately simulated using a Bobbert–Vlieger model, and non-spherical particle spectra can be approximated by spherical results. The Bobbert–Vlieger model can then be used to create a library that can account for the trace chemical and underlying substrate for standoff chemical identification.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.