Abstract

Ground cover competition and tree training strongly affect development of newly planted peach trees and eventual productivity of peach orchards. This experiment characterized the long-term interactive effects of three levels of competition and two pruning criteria on yield, fruit size, and marketable yield efficiency. Trees of two cultivars (’Jersey Dawn’, JD, and ‘Redskin’, RS, on Lovell) of peach ( Prunus persica (L.) Batsch) were planted in an orchard in 1993 and grown for 14 years in a vegetation free area (VFA) width of 0.6 or 2.4 m. A separate group of trees that were in the 2.4 m VFA had grass seeded beneath them in 1998 to obtain 0 m VFA. All trees were pruned to maintain canopy size with wide-angled scaffold limbs and intense pruning (IP) or upright branch form with reduced pruning (RP). In general, RS had greater yield than JD and yield was greatest in the 2.4 m VFA with RP and least in the 0.6 m VFA with IP. Cumulative marketable (≥6.35 cm) and average annual total yield of both cultivars was similar for RP trees in 0 m VFA and IP trees in 2.4 m VFA's although more of the fruit were in the largest size class (>6.98 cm) in the IP trees. Reduced pruning increased crop load. Fruit weight decreased with increased crop load more in RS than JD and this response was similar for all VFA's within each cultivar. Grass competition tended to reduce both the number and weight of fruit per tree but the average weight of individual marketable fruit was reduced only in the 0.6 m VFA of RS. Tree size was reduced by grass competition and pruning times measured from 1995 to 2000 were less in RP than IP. Consequently, marketable yield efficiency of marketable fruit (grams fruit ≥6.35 cm/cm 2 trunk cross-sectional area, TCSA) measured from 2004 to 2007 was generally greater in trees with RP than IP and in the 0.6 than the 0 and 2.4 m VFA. The results indicate that persistent competition will reduce total annual yield per tree but with reduced pruning the concomitant increased crop load can help maintain marketable yield.

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