Long-range internal stresses in cell and subgrain structures of copper during deformation at constant stress

Abstract

Long-range internal stresses in dislocation cell and subgrain structures were investigated experimentally. The transition of the dislocation structure from cells to subgrains was achieved by deforming copper polycrystals in compression creep tests at constant stress normalized by the shear modulus in the temperature range from 298 K to 633 K. The long-range internal stresses were investigated by two methods. The first one was the evaluation of characteristically asymmetric X-ray line profiles. The internal stresses are the result of the analysis of the X-ray line profiles. The second one was the measurement of local lattice parameters by convergent beam electron diffraction. The internal stresses can be determined from the changes in the local lattice parameters. The results obtained from both methods show that long-range internal stresses of the same type exist in the cell as well as in the subgrain structures.