Abstract
The grain-boundary model proposed by Mayadas et al. has been used to calculate the longitudinal-strain coefficient of resistivity of continuous polycrystalline silver film, with a thickness greater than the intrinsic mean free path, in terms of grain-size diameter. It has been found that the longitudinal-strain coefficient of resistivity increases with grain size, and its range is from zero to bulk value as the grain size goes from zero to very large value.
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