Abstract
The longitudinal magnetoresistance Δϱ‖(H)/ϱ0 is studied experimentally in gapless solid solutions CdxHg1−xTe (0 < x < 0.15) for temperatures 1.3–15 K and the electron concentrations n ∼ 1015 cm−3. The temperature and the magnetic field dependences of the observed negative longitudinal magnetoresistance are explained by the resonant nature of electron scattering by an acceptor level. The quantitative analysis of the Δϱ‖(H)ϱ0 field dependence for weak magnetic fields under strong carrier degeneracy makes it possible to evaluate parameters of the acceptor level involved.
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