Abstract
In electron guns, generating high-intensity beams comes with the cost of increasing the number of secondary ions produced by the residual gas ionization which can be a limiting factor in the cathode lifetime. However, it is often overlooked that the longitudinal potential generated by the beam can be the main factor influencing secondary ions to drift back toward the source and limit the maximum beam intensity. Using 3D simulations, this paper shows how the flux of trapped ions depends on the beam parameters. The results provide a practical framework that can be used as a guide in the design of the electron gun focal point to mitigate the ion back bombardment. Published by the American Physical Society 2024
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
