Long-term stability of graphene/c-Si Schottky-junction solar cells

Abstract

A long operational lifetime is required for the use of solar cells in real-life photovoltaic applications. The optimization of operational lifetimes is achieved through understanding the inherent degradation phenomena in solar cells. In this study, graphene/Si Schottky-junction solar cells were produced, utilizing liquid-phase-exfoliated graphene as an active surface. The operational and interface stability of these solar cells over a period of 5 years in ambient conditions (following ISOS-D protocols: dark storage/shelf life) was examined, and the origin of their degradation was reported. It was found that the dominant degradation mechanism could be attributed to the degradation of silver contacts. This was indicated by a decrease in shunt resistance, an increase in the ideality factor (due to a higher carrier recombination), and a constant defect density in graphene films for up to 4 years. Measurements across the solar cell's active area during the 5-year period revealed neither significant spatial inhomogeneity, nor shunt channel defects.