Abstract

We have studied the mutagenic effects of benzo[α]pyrene (BP) administered in a long-term, low-dose fashion to metabolically competent human lymphoblastoid cells. A continuous dose as low as 0.02 μM for 20 days produced a significant increase in mutant fraction at the 6TG-resistance (HGPRT) locus. The slope of the mutant fraction over time in the 0.02 μM BP-treated culture was twice that observed in the untreated concurrent control; 0.02 μM therefore represents the doubling dose of BP for gene mutation in this cell line. For higher doses of 0.1, 0.5 or 1 μM BP, the rate (or efficiency) of induced mutation was considerably higher for the first 5 or 6 days of exposure than for the last 14–15. This did not appear to be due to a growth disadvantage against early-arising mutants. Comparison to previously published data in the same cell system (Crespi and Thilly, 1984) revealed that the long-term, low-dose protocol (0–1 μM for up to 20 days) was significantly more efficient at inducing mutations than a short-term, high-dose protocol (0–10 μM for 1 day).

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