Abstract
Nd1−xSmx(Mg0.5Ti0.5)O3 (x=0.0–1.0) samples were prepared by solid-state reaction method. Rietveld refinement of X-ray diffraction data was done using P21/n space group with monoclinic symmetry, which supports 1:1 B-site cation ordering. Long range ordering (LRO) parameter decreased up to x=0.5 and then found to increase with further increase in Sm concentration. The A1g-like mode in Raman spectra was observed to possess Briet–Wigner–Fano line shape. The variation in obtained line width of the A1g-like mode supported LRO. Microwave dielectric characteristics such as dielectric constant (ɛr), quality factor (Q) and temperature coefficient of resonant frequency (τf) were measured in the range of 7–9GHz. ɛr decreased from 26.5 to 24.9 and τf become less negative from −58ppm/°C to −36ppm/°C with increase in Sm concentration. Q×f decreased from 47,500GHz (for x=0) to 39,800GHz (for x=0.5) and then increased to 44,600GHz (for x=1).
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