Abstract
Scale-up matters for ion-beam-assisted deposition (IBAD) method was surveyed on biaxially textured yttria-stabilized-zirconia (YSZ) buffer layer by using 66 cm×6 cm square-shaped RF-discharged ion source. Textured YSZ films with the in-plane mosaic spread ( Δφ) of 9–15 were obtained in the growth area of 60×8 cm 2 by optimizing the beam collimation for the assisting Ar ions. 5.5 m long YSZ textured template layers were formed with 0.1 m/h by IBAD on Ni–Cr alloy tapes with the Δφ of 12–13° in whole length. The Δφ of 10.8° was obtained in a short tape moved with 0.3 m/h. Y-123 films were deposited by PLD on the YSZ templates with tape shifting speed of 1.0 m/h. I c of 84.0 Å and J c of 0.76 MA/cm 2 were obtained at 77 K, 0 T in the length of 1.0 m with Δφ for the Y-123 film was 7°.
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