Abstract
In the field of spectroscopy, a splicing correction is a process by which two spectra captured with different sensors in adjacent or overlapping electromagnetic spectrum ranges are smoothly connected. In our study, we extend this concept to the case of reflectance imaging spectroscopy in the visible-near-infrared (VNIR) and short-wave infrared (SWIR), accounting for additional sources of noise that arise at the pixel level. The proposed approach exploits the adaptive fitting of a logistic function to compute correcting coefficients that harmonize the two spectral sets. This short Letter addresses usage conditions and compares results against the existing state of the art.
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