Abstract
The yield and grain quality of spring and winter wheat signif icantly depends on varieties' resistance to lodging, the genetic basis of this trait being quantitative and controlled by a large number of loci. Therefore, the study of the genetic architecture of the trait becomes necessary for the creation and improvement of modern wheat varieties. Here we present the results of localization of the genomic regions associated with resistance to lodging, plant height, and upper internode diameter in Russian bread wheat varieties. Phenotypic screening of 97 spring varieties and breeding lines was carried out in the f ield conditions of the West Siberian region during 2017-2019. It was found that 54 % of the varieties could be characterized as medium and highly resistant to lodging. At the same time, it was noted that the trait varied over the years. Twelve varieties showed a low level of resistance in all years of evaluation. Plant height-based grouping of the varieties showed that 19 samples belonged to semi-dwarfs (60-84 cm), and the rest were included in the group of standard-height plants (85-100 cm). Quantitative trait loci (QTL) mapping was performed by means of genome-wide association study (GWAS) using 9285 SNP markers. For lodging resistance, plant height, and upper internode diameter, 26 signif icant associations (-log p > 3) were found in chromosomes 1B, 2A, 3A, 3D, 4A, 5A, 5B, 5D, 6A, and 7B. The results obtained suggest that the regions of 700-711 and 597-618 Mb in chromosomes 3A and 6A, respectively, may contain clusters of genes that affect lodging resistance and plant height. No chromosome regions colocalized with the QTLs as sociated with lodging resistance or upper internode diameter were found. The present GWAS results may be important for the development of approaches for creating lodging-resistant varieties through marker-assisted and genomic selection.
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