Abstract
Microscopic plastic behavior of high purity commercial Vitreloy 1b glassy disks subjected to high pressure torsion was investigated by analyzing the distortion of a marker grid produced by focused ion beam milling. Scanning electron microscopy and atomic force microscopy are applied to measure offsets of shear bands at the surface. Unlike in other macroscopic deformation tests, short and wavy shear bands with submicron offsets and substantial normal offset components are observed indicating concurrent formation of numerous bands. Material pile-ups along major shear bands result in healing of the glass counterparts.
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