Abstract

Local image descriptors have proved themselves as useful tools for many computer vision tasks such as matching points between multiple images of a scene and object recognition. Current descriptors, such as SIFT, are designed to match image features with unique local neighborhoods. However, the interest point detectors used with SIFT often fail to select perceptible local structures in the image, and the SIFT descriptor does not directly encode the local neighborhood shape. In this paper we propose a symmetry based interest point detector and radial local structure descriptor which consistently captures the majority of basic local image structures and provides a geometrical description of the structure boundaries. This approach concentrates on the extraction of shape properties in image patches, which are an intuitive way to represent local appearance for matching and classification. We explore the specificity and sensitivity of this local descriptor in the context of classification of natural patterns. The implications of the performance comparison with standard approaches like SIFT are discussed.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.