Abstract
Techniques for the measurement of local pole figures in the Transmission Electron Microscope (TEM) are summarized and applications to deformed aluminum are given. Local pole figures are obtained by measuring the intensity distribution along ring patterns in Selected Area Diffraction (SAD) separately for various tilts of the specimen with respect to the incident electron beam. The computer control of the TEM allows a data acquisition in reasonable time. The measured intensities are corrected either experimentally or analytically for the increase of sampled volume and for the increased absorption with increasing tilt angle of the specimen. The application of orientation distribution functions (ODF) using the series expansion technique in conjunction with the positivity method allows a quantitative texture analysis of the pole figures.
Highlights
There are times when it is necessary to measure crystallographic texture on an extremely local scale
The parent matrix is determined by the local pole figure technique, while the orientation of the nucleus is determined from a Kikuchi pattern in convergent beam technique
Summary
There are times when it is necessary to measure crystallographic texture on an extremely local scale. In a TEM, information on the local texture of a material is obtained either by the measurement of individual grain orientations from Kikuchi patterns (Weiland, 1985) or by the measurement of local pole figures (Schwarzer, 1982; Humphreys, 1983; Schwarzer and Weiland, 1985). Local pole figures are obtained by the measurement of the intensity in selected area diffraction (SAD) patterns for different geometries of the sample with respect to the incident electron beam. The shape of this unmeasured area complicates the numerical calculations It is the aim of this paper, to review the basics of the measurement techniques and to outline the methods for a quantitative analysis of local pole figures obtained
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