Abstract
A new, exact and efficient numerical method for calculating the effective conductivity and local-field distributions in random R-L-C networks is developed. Using this method, the local field properties of random metal dielectric films are investigated in a wide spectral range and for a variety of metal concentrations p. It is shown that for metal concentrations close to the percolation threshold (p = p c) and frequencies close to the resonance, the local field intensity is characterized by a non-Gaussian, exponentially broad distribution. For low and high metal concentrations a scaling region is formed that is due to the increasing number of non-interacting dipoles. The local electric fields are studied in terms of characteristic length parameters. Properties of both localized and extended eigenmodes in the Kirchhoff’s Hamiltonian are investigated.
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