Local field loop measurements by magnetic force microscopy

Abstract

Magnetic force microscopy (MFM) is a valuable technique to investigate the reversal mechanisms of the magnetization in micrometric and sub-micrometric-patterned thin films that cannot be studied by means of magneto-optical methods because of their limited resolution. However, acquiring tens or hundreds of images consecutively at different applied magnetic fields is often impossible or impractical. Therefore, a field-dependent MFM-derived technique is discussed and applied on square and circular dots of different materials (Ni80Fe20, Co67Fe4Si14.5B14.5, Fe78Si9B13) having sizes ranging from 800 nm to 20 µm. Experimental local hysteresis loops are obtained by properly analysing the phase signal of the MFM along a selected profile of the studied patterned structure, as a function of the applied magnetic field. Characteristic features of the magnetization process, such as vortex nucleation and expulsion, transition from C-state to saturated state or domain wall motion in Landau-like domain configuration are identified, and their evolution with the applied field is followed. The necessity to combine experimental and theoretical analyses is addressed by micromagnetic simulations on a model system (a Ni80Fe20 square dot with a lateral size of 800 nm), comparable to one of the studied samples. The agreement between experimental and simulated MFM maps, at different applied fields, and hysteresis loops provides the necessary validation for the technique. Additionally, the simulations have been proven to be necessary to understand the magnetization reversal processes occurring in the studied sub-micrometric structures and to associate them with characteristic features of the hysteresis loops measured with the proposed technique.