Abstract

Nanoscale elastic properties of twinned martensite NiMnGa films were characterized by means of atomic force acoustic microscopy using cantilever contact-resonance spectra to measure the local contact stiffness k* and the local damping Q−1, which contains information on the crystallographic anisotropy of martensitic twin variants and the dissipative motion of twin boundaries (TBs). Images of k* and indentation modulus maps were obtained. Similar to topography images measured by conventional atomic force microscopy in contact mode, they show the nature of the twin structure and thus a regular variation in local elastic modulus. A correlation between k* and Q−1 was observed and mirrors the motion of the TB accompanied by a viscoelastic procedure. The k*-image and the topography image measured are opposite in contrast, which likely arises from mobile and immobile TBs depending on the geometry of twinning. Multi-resonance spectra were measured, which can be related to martensitic multivariants and are explainable as different types of nanotwins. A critical stress, defined as the starting point of softening due to TB movement was determined to be about 0.5 GPa for a thick film (1 μm) and 0.75 GPa for a thin film (0.15 μm), respectively. The values are much larger than that measured for bulk materials, but reasonable due to a large internal stress in the films.

Highlights

  • The Ni2MnGa compound is a technologically important material for its large magnetic shape memory (MSM) effect

  • Local elastic properties were measured for twinned martensitic films of NiMnGa alloys by means of atomic force acoustic microscopy (AFAM)

  • Images of k∗ and indentation modulus maps on nanometer scales were obtained and demonstrate variations in local moduli regarding the mobility of twin boundaries (TBs) and/or the crystallographic anisotropy of twin variants

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Summary

Introduction

The Ni2MnGa compound is a technologically important material for its large magnetic shape memory (MSM) effect. The driving field is less than 1 T and the critical stress σc is within 0.5–1.0 MPa for bulk materials [2,3,4,5]. A residual stress of about 50–250 MPa was reported for the films deposited on MgO [7, 9, 10] which is much larger than σc measured for stress-free bulk materials. Another factor is the adhesion to the rigid substrate, which suppresses the reorientations of twin variants and impedes the MSM effect. Because one can supply locally a large stress close to 1 GPa with the tip of the cantilever, this should be technically feasible

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