Abstract
The local crystal phase and orientation of ferroelectric grains inside TiN/Hf0.5Zr0.5O2/TiN have been studied by the analysis of the local electron beam scattering Kikuchi patterns, recorded in transmission. Evidence was found that the ferroelectric phase of the layers is derived from an orthorhombic phase, most likely of space group Pca21. The orientation analysis reveals a strong out-of-plane texture of the polycrystalline film which is in accordance with a high remanent polarization Pr observed for P-V measurements. The results of this analysis help us to further optimize the ratio of ferroelectric grains and their orientation for many applications, e.g., in the field of emerging memory or infrared sensors.
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