Abstract
Two methods to obtain information about the local ionic conductivity by using point electrode techniques coupled with atomic force microscopy (AFM) are presented. The first method makes use of the fact that the main resistance drop occurs in a very small region beneath a point electrode reflecting the local conductivity. By varying the position coordinate of the point electrode an inhomogeneous impurity profile of Cd 2+ in AgCl was detected. In this way, diffusion coefficients can be easily measured. As a second method, the point diameter is varied and thus the thickness and conductivity as well as the conductivity activation energy of mechanically induced highly conducting surface layers could be measured which otherwise would hardly have been detected. The method is applied to mechanically pretreated AgCl. For both methods it proved necessary to measure reliably the impedance as high as 500 GΩ.
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