Abstract
Compositionally graded PZT thin film was prepared by a sol–gel technique. Nanoscale domain structure and polarization reversal behavior in an individual grain were investigated by means of scanning force microscopy (SFM) in piezoresponse mode. Domain as small as 30 nm in size was visualized. The observed complex domain contrast was attributed to the crystallographic orientation of the grains and to the built-in potential difference in compositionally graded PZT thin film under an ac field. The built-in potential difference, defect and space charge gave rise to strong domain pinning behavior during the polarization reversal.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
