Abstract
Aiming to study the solid-state diffusion of lithium into pure and lithium doped niobium pentoxide (Nb2O5) thin sol-gel films were investigated by galvanostatic intermittent titration technique (GITT) and electrochemical impedance spectroscopy (EIS). The obtained values of the diffusion coefficient were 2.5 × 10−11 at x = 0.83 and 7.4 × 10−13 at x = 1.65 for pure and doped Nb2O5 films respectively. The impedance results of both kinds of films adjusted by equivalent circuits showed very good agreement between experimental and theoretical data.
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