Abstract
Abstract Helium ions of 500 keV were implanted with a fluence of 1.4 × 1017 ion/cm2 into various lithium silicates to investigate whether a threshold level of helium retention exists in Li-containing silicate ceramics similar to that found in SiOx in previous work. The composition and phases of the as prepared lithium silicates were determined by proton backscattering spectrometry (p-BS) and X-ray diffraction (XRD) methods with an average error of ±10%. Electrostatic charging of the samples was successfully eliminated by wrapping the samples in Al foil. The amounts of the retained helium within the samples were determined by subtracting the non-implanted spectra from the implanted ones. The experimental results show a threshold in helium retention depending on the Li concentration. Under 20 at.% all He is able to escape from the material; at around 30 at.% nearly half of the He, while over 65 at.% all implanted He is retained. With compositions expressed in SiO2 volume percentages, a trend similar to those reported of SiOx previously is found.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
